BibTeX record journals/mr/BrunelLMBFGBCGMCL13

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@article{DBLP:journals/mr/BrunelLMBFGBCGMCL13,
  author       = {Laurent Brunel and
                  Benoit Lambert and
                  P. Mezenge and
                  J. Bataille and
                  D. Floriot and
                  Jan Gr{\"{u}}nenp{\"{u}}tt and
                  Herv{\'{e}} Blanck and
                  D. Carisetti and
                  Y. Gourdel and
                  Nathalie Malbert and
                  Arnaud Curutchet and
                  Nathalie Labat},
  title        = {Analysis of Schottky gate degradation evolution in AlGaN/GaN HEMTs
                  during {HTRB} stress},
  journal      = {Microelectron. Reliab.},
  volume       = {53},
  number       = {9-11},
  pages        = {1450--1455},
  year         = {2013},
  url          = {https://doi.org/10.1016/j.microrel.2013.07.095},
  doi          = {10.1016/J.MICROREL.2013.07.095},
  timestamp    = {Sat, 22 Feb 2020 19:28:55 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/BrunelLMBFGBCGMCL13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}