"A review of gate tunneling current in MOS devices."

Juan C. Ranuárez, M. Jamal Deen, Chih-Hung Chen (2006)

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DOI: 10.1016/J.MICROREL.2005.12.006

access: closed

type: Journal Article

metadata version: 2020-03-27

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Juan C. Ranuárez, M. Jamal Deen, Chih-Hung Chen:
A review of gate tunneling current in MOS devices. Microelectron. Reliab. 46(12): 1939-1956 (2006)

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