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ORCIDPattern Recognition, Volume 4
Volume 4, Number 1, January 1972
- Robert S. Ledley:
Editorial comment. 1 - King-Sun Fu:
Introduction to special issue on syntactic pattern recognition--part two. 3 - Theodosios Pavlidis:
Representation of figures by labeled graphs. 5-17 - Kenneth J. Breeding, John O. Amoss:
A pattern description language - PADEL. 19-36 - John Mylopoulos:
On the application of formal language and automata theory to pattern recognition. 37-51 - Luigia Carlucci:
A formal system for texture languages. 53-72 - J. C. Simon, A. Checroun, C. Roche:
A method of comparing two patterns independent of possible transformations and small distortions. 73-81 - Philip H. Swain, King-Sun Fu:
Stochastic programmed grammars for syntactic pattern recognition. 83-100 - I. B. Muchnik:
Simulation of process of forming the language for description and analysis of the forms of images. 101-140
Volume 4, Number 2, May 1972
- Robert S. Ledley:
Introduction to the special issue on fine particle science. 145 - Brian H. Kaye:
Efficient pattern recognition in fine particle science. 147-150 - A. I. Medalia, G. J. Hornik:
Pattern recognition problems in the study of carbon black. 155-158 - E. W. White, Kathy Mayberry, Gerald G. Johnson Jr.:
Computer analysis of multi-channel SEM and X-ray images from fine particles. 173-192 - Brian H. Kaye, A. G. Naylor:
An optical information procedure for characterizing the shape of fine particle images. 195-196 - C. B. Shelman:
The application of list processing techniques to picture processing. 201-210 - Edward A. Patrick, Joseph Altman, Richard Wild:
Computer output display of cells and cell features. 211-226
Volume 4, Number 3, October 1972
- Robert S. Ledley:
About this issue. Pattern Recognit. 4(3): 233 (1972) - John F. Betak:
Measuring two-dimensional complexity: A conceptual structure. 235-242 - Yoshiaki Shirai:
Recognition of polyhedrons with a range finder. 243-244 - Kokichi Tanaka, Kazumasa Ozawa:
A new type of feature extraction of patterns using coherent optical system. 251-262 - David M. Jackson, Lee J. White:
Effect of random errors on generalized distance computations. 263-273 - Robert M. Bowman, Eugene S. McVey:
Calculation of multi-category minimum distance classifier recognition error for binomial measurement distributions. 275-288 - Tsuguchika Kaminuma, Satosi Watanabe:
Fast-converging adaptive algorithms for well-balanced separating linear classifier. 289-305 - Israel Gitman:
A parameter-free clustering model. 307-315 - Ronald L. Citrenbaum:
Strategic pattern generation: A solution technique for a class of games. 317-329 - William John Sacco, Wayne S. Copes:
Reduction of the class of feature evaluation techniques in pattern analysis. 331-332
Volume 4, Number 4, December 1972
- Robert S. Ledley:
About this issue. 341 - Yoshiaki Shirai, Saburo Tsuji:
Extraction of the line drawing of 3-dimensional objects by sequential illumination from several directions. 343-344 - Sheldon S. Sandler:
Direct three-dimensional analysis of electron micrograph pictures. 353-359 - Oscar Firschein, Martin A. Fischler:
A study in descriptive representation of pictorial data. 361-366 - D. W. Thomas, Brian R. Wilkins:
The analysis of vehicle sounds for recognition. 379-389 - Lucio Pietrantonio, Peter C. Jurs:
Iterative least squares development of discriminant functions for spectroscopic data analysis by pattern recognition. 391-400 - Periagaram K. Rajasekaran, Mandyam D. Srinath:
Unsupervised learning in nongaussian pattern recognition. 401-416
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