Figure 3: T1 variation with qubit frequency and noise modelling. | Nature Communications

Figure 3: T1 variation with qubit frequency and noise modelling.

From: The flux qubit revisited to enhance coherence and reproducibility

Figure 3

(a) Energy-relaxation time T1 versus qubit frequency for Qubit C (Csh,C=9 fF, Ip,C=275 nA, Δc/2π=0.82 GHz) plotted with simulated T1 values for individual (dashed lines) and aggregate (solid line) charge, flux and Purcell noise mechanisms. Absence of data around 4 GHz is related to an ancillary qubit level crossing the readout resonator, prohibiting qubit readout and is not a systematic issue. Qubit C is limited by flux noise below about 4.5 GHz. For comparison, the functional form for ohmic flux noise (grey dotted line) is incompatible with the data below 3 GHz; above 3 GHz, its role cannot be readily distinguished from charge noise (see text). Shaded region indicates the range of predicted T1 in the presence of 0–1.0 quasiparticles. (b) Flux noise spectroscopy performed on Qubit B using Ramsey interferometry (red) and T1ρ spin-locking (blue) to determine parameters AΦ2=(1.4 μΦ0)2/Hz and γ =0.9 for the inverse-frequency flux noise (black dashed line) for qubit C (a). Green and black dots: inferred ohmic flux noise SΦ based on measured T1 in a. (c) Energy-relaxation time T1 versus qubit frequency for qubit B (Csh,B=51 fF, Ip,B=49 nA, ). T1 is sensitive predominantly to ohmic charge noise within 5–6.5 GHz range. Scatter in T1 is attributed to quasiparticle fluctuations. Cluster of lower T1 values near 5.5 GHz is due to interaction with the f12 transition. Shaded region indicates the range of predicted T1 in the presence of 0–1.0 quasiparticles. (d) T1 values for 22 qubits with widely varying design parameters, measured at their degeneracy points and plotted against predicted T1 values (dashed line) determined from numerical simulations using a single model with fixed noise levels (see main text). Practically indistinguishable data points (eight in total) are indicated with arrows.

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